发明名称 Methods, devices and systems using over-reset state in a memory cell
摘要 Memory cells, devices and methods are disclosed, including those that involve applying a waveform to a resistive memory cell to program the memory cell to an over-reset state representing a logic value.
申请公布号 US9117519(B2) 申请公布日期 2015.08.25
申请号 US201213597692 申请日期 2012.08.29
申请人 MICRON TECHNOLOGY, INC. 发明人 Spessot Alessio;Fantini Paolo;Ferro Massimo
分类号 G11C13/04;G11C13/00;G11C11/56 主分类号 G11C13/04
代理机构 Knobbe, Martens, Olson & Bear LLP 代理人 Knobbe, Martens, Olson & Bear LLP
主权项 1. A method, comprising: applying a waveform to a resistive memory cell in a memory array to program the memory cell to an over-reset state representing a logic value, wherein the waveform has a single fall time that is longer than a corresponding fall time of a different waveform that has been applied to a different memory cell in the memory array for a reset state or a second over-reset state representing a second logic value and having a resistance higher than that of the over-reset state.
地址 Boise ID US