发明名称 |
Methods, devices and systems using over-reset state in a memory cell |
摘要 |
Memory cells, devices and methods are disclosed, including those that involve applying a waveform to a resistive memory cell to program the memory cell to an over-reset state representing a logic value. |
申请公布号 |
US9117519(B2) |
申请公布日期 |
2015.08.25 |
申请号 |
US201213597692 |
申请日期 |
2012.08.29 |
申请人 |
MICRON TECHNOLOGY, INC. |
发明人 |
Spessot Alessio;Fantini Paolo;Ferro Massimo |
分类号 |
G11C13/04;G11C13/00;G11C11/56 |
主分类号 |
G11C13/04 |
代理机构 |
Knobbe, Martens, Olson & Bear LLP |
代理人 |
Knobbe, Martens, Olson & Bear LLP |
主权项 |
1. A method, comprising:
applying a waveform to a resistive memory cell in a memory array to program the memory cell to an over-reset state representing a logic value, wherein the waveform has a single fall time that is longer than a corresponding fall time of a different waveform that has been applied to a different memory cell in the memory array for a reset state or a second over-reset state representing a second logic value and having a resistance higher than that of the over-reset state. |
地址 |
Boise ID US |