发明名称 |
Method for manufacturing shallow trench isolation |
摘要 |
A method for manufacturing a semiconductor structure includes the following steps. First, a semiconductor substrate is provided and a patterned pad layer is formed on the semiconductor substrate so as to expose a portion of the semiconductor substrate. Then, the semiconductor substrate exposed from the patterned pad layer is etched away to form a trench inside the semiconductor substrate. A selectively-grown material layer is selectively formed on the surface of the trench, followed by filling a dielectric precursor material into the trench. Finally, a transformation process is carried out to concurrently transform the dielectric precursor material into a dielectric material and transform the selectively-grown material layer into an oxygen-containing amorphous material layer. |
申请公布号 |
US9117878(B2) |
申请公布日期 |
2015.08.25 |
申请号 |
US201213710483 |
申请日期 |
2012.12.11 |
申请人 |
UNITED MICROELECTRONICS CORP. |
发明人 |
Lin Keng-Jen;Wang Yu-Ren;Chen Chih-Chung;Lu Tsuo-Wen;Wen Tsai-Yu |
分类号 |
H01L21/76;H01L21/762;H01L21/02;H01L21/321 |
主分类号 |
H01L21/76 |
代理机构 |
|
代理人 |
Hsu Winston;Margo Scott |
主权项 |
1. A method for manufacturing a semiconductor structure, comprising:
providing a semiconductor substrate; forming a patterned pad layer on the semiconductor substrate so as to expose a portion of the semiconductor substrate; etching the semiconductor substrate exposed from the patterned pad layer to form a trench; selectively forming a selectively-grown material layer on a surface of the trench; filling a dielectric precursor material into the trench; and performing a transformation process so as to concurrently transform the dielectric precursor material into a dielectric material and transform the selectively-grown material layer into an oxygen-containing amorphous material layer, wherein the dielectric precursor material is under liquid state before the transformation process is performed. |
地址 |
Science-Based Industrial Park, Hsin-Chu TW |