发明名称 Method for manufacturing shallow trench isolation
摘要 A method for manufacturing a semiconductor structure includes the following steps. First, a semiconductor substrate is provided and a patterned pad layer is formed on the semiconductor substrate so as to expose a portion of the semiconductor substrate. Then, the semiconductor substrate exposed from the patterned pad layer is etched away to form a trench inside the semiconductor substrate. A selectively-grown material layer is selectively formed on the surface of the trench, followed by filling a dielectric precursor material into the trench. Finally, a transformation process is carried out to concurrently transform the dielectric precursor material into a dielectric material and transform the selectively-grown material layer into an oxygen-containing amorphous material layer.
申请公布号 US9117878(B2) 申请公布日期 2015.08.25
申请号 US201213710483 申请日期 2012.12.11
申请人 UNITED MICROELECTRONICS CORP. 发明人 Lin Keng-Jen;Wang Yu-Ren;Chen Chih-Chung;Lu Tsuo-Wen;Wen Tsai-Yu
分类号 H01L21/76;H01L21/762;H01L21/02;H01L21/321 主分类号 H01L21/76
代理机构 代理人 Hsu Winston;Margo Scott
主权项 1. A method for manufacturing a semiconductor structure, comprising: providing a semiconductor substrate; forming a patterned pad layer on the semiconductor substrate so as to expose a portion of the semiconductor substrate; etching the semiconductor substrate exposed from the patterned pad layer to form a trench; selectively forming a selectively-grown material layer on a surface of the trench; filling a dielectric precursor material into the trench; and performing a transformation process so as to concurrently transform the dielectric precursor material into a dielectric material and transform the selectively-grown material layer into an oxygen-containing amorphous material layer, wherein the dielectric precursor material is under liquid state before the transformation process is performed.
地址 Science-Based Industrial Park, Hsin-Chu TW