Magnetic property analyzing apparatus and method

摘要

A magnetic property analyzing apparatus includes a first computing unit to perform a magnetic field analysis utilizing a FEM using an average magnetization given with respect to each of elements to which an analyzing target is segmented, and a second computing unit that computes an effective magnetic field acting on each element using a magnetic field computed by the magnetic field analysis, computes magnetization vectors within each element by obtaining a time integral of a LLG equation using the effective magnetic field, and computes an average magnetization for each element by averaging the magnetization vectors.

主权项

1. A magnetic property analyzing apparatus comprising:
a processor including a first computing unit and a second computing unit, wherein the first computing unit is configured to perform a magnetic field analysis utilizing a FEM (Finite Element Method) by computation, using an average magnetization given with respect to each of elements to which an analyzing target is segmented, wherein the second computing unit includes
an effective magnetic field computing unit configured to compute an effective magnetic field acting on each of the elements using a magnetic field computed by the magnetic field analysis as a fixed value;a magnetization vector computing unit configured to compute magnetization vectors within each of the elements by obtaining a time integral of a LLG (Landau Lifshitz Gilbert) equation using the effective magnetic field computed by the effective magnetic field computing unit; andan average magnetization computing unit configured to compute the average magnetization for each of the elements by averaging the magnetization vectors computed by the magnetization vector computing unit.