发明名称 METHOD OF MANUFACTURING GATE INSULATION LAYER
摘要 <p>PROBLEM TO BE SOLVED: To provide a method of manufacturing a gate insulation layer satisfying both stability of a TFT (thin film transistor), and a static protection function.SOLUTION: A method of manufacturing a gate insulation layer includes a step of obtaining a gate insulation layer where a silicon nitride layer and a silicon oxide layer are laminated in order, by depositing the silicon nitride layer and the silicon oxide layer in order on a Cu gate, by using chemical vapor deposition. The silicon nitride layer prevents oxidation of the Cu gate by blocking oxygen effectively, and the silicon oxide layer prevents reduction of an active semiconductor layer by blocking hydrogen effectively.</p>
申请公布号 JP2015154078(A) 申请公布日期 2015.08.24
申请号 JP20150010201 申请日期 2015.01.22
申请人 EVERDISPLAY OPTRONICS (SHANGHAI) LTD 发明人 HUANG CHIA-CHI;HSU MIN-CHING;LUO YI TENG;LEE YUANHSIN
分类号 H01L29/786;H01L21/283;H01L21/316;H01L21/318;H01L21/336 主分类号 H01L29/786
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