发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To improve the degree of freedom in pad arrangement while avoiding reduction in calibration performance.SOLUTION: A terminal row is configured by arranging a plurality of terminals including a higher-order power supply terminal 21 for data, a lower-order power supply terminal 22 for data, a data input/output terminal 20, a calibration terminal 25 and a higher-order power supply terminal 26 in one row in a first direction. The terminals 21 and 22 are disposed adjacently to the terminal 20 within the terminal row, respectively, and the terminal 26 is disposed at a position that is not adjacent to the terminal 20 within the terminal row. A P-side replica circuit 15r1 is configured by connecting an end that corresponds to a connection end with the terminal 21 in a pull-up circuit, to the terminal 26. A replica output circuit 15r is configured by connecting an end that corresponds to a connection end with the terminal 21 in an output circuit, to the terminal 21 and connecting an end that corresponds to a connection end with the terminal 22 in the output circuit, to the terminal 22.
申请公布号 JP2015154316(A) 申请公布日期 2015.08.24
申请号 JP20140027370 申请日期 2014.02.17
申请人 MICRON TECHNOLOGY INC 发明人 TAKEDA HIROMASA;FUJISAWA HIROKI
分类号 H03K19/0175;G11C11/407;G11C11/4093;H01L21/822;H01L27/04 主分类号 H03K19/0175
代理机构 代理人
主权项
地址