CIRCUIT FOR MEASURING LEAKAGE CURRENT IN SEMICONDUCTOR INTEGRATED CIRCUIT

摘要

A leakage current measuring circuit is disclosed which can measure the leakage current of transistors or functional blocks in a chip of semiconductor integrated circuit. The leakage current measuring circuit comprises: an operating amplifier; a first PMOS transistor; a first switch; a second PMOS transistor; a resistor; and an analog-digital (A/D) converter. The operating amplifier amplifies the difference between the reference voltage and feedback voltage. The first PMOS transistor has a gate to which output voltage of the operating amplifier is applied, a source connected to the first power voltage and a drain connected to a feedback node. The first switch is connected to the feedback node and a test block. The second PMOS transistor has a gate which is connected to the gate of the first PMOS transistor and a source which is connected to the first power voltage. The resistor is connected between a drain of the second PMOS transistor and the grounding. The analog-digital (A/D) converter executes analog-digital (A/D) conversion of the first voltage signals which are applied to both ends of the resistor and generates output data.