发明名称 SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To obtain a semiconductor device which corresponds to high temperature and has high reliability.SOLUTION: A semiconductor device comprises: an insulating substrate 4; and semiconductor elements (IGBT2, SBD3) bonded to the insulating substrate 4 via sintered bonding parts 5 by sintering reaction. Each sintered bonding part 5 is formed on an inner region at a distance from an outer periphery (lateral face S2) of the semiconductor element. Or in a manufacturing method, a bonding materia, 5P is arranged so as to fall within an inner range at a distance from the outer periphery of the semiconductor.
申请公布号 JP2015153966(A) 申请公布日期 2015.08.24
申请号 JP20140028118 申请日期 2014.02.18
申请人 MITSUBISHI ELECTRIC CORP 发明人 TATSUMI HIROAKI;KUMADA SHO;SHONO TOMOTAKA;KIMOTO NOBUYOSHI
分类号 H01L21/52 主分类号 H01L21/52
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