发明名称 |
SEMICONDUCTOR DEVICE MANUFACTURING METHOD |
摘要 |
<p>PROBLEM TO BE SOLVED: To provide a semiconductor device manufacturing method capable of reducing a heat treatment time of a semiconductor substrate to a further degree.SOLUTION: A semiconductor device manufacturing method comprises: a semiconductor substrate preparation process (S10); a preheating process (S20) of placing the semiconductor substrate on a placement surface of a first heated member and heating the semiconductor substrate after forming a temperature distribution in a thickness direction of the semiconductor substrate; a chucking process (S30) of placing and fixing the semiconductor substrate heated in the preheating process on an electrostatic chuck; an actual heating process (S40) of heating the semiconductor substrate fixed on the electrostatic chuck; and an ion implantation process (S50) of implanting ion into the semiconductor substrate heated in the actual heating process. In the preheating process (S20), the temperature distribution is formed in a manner such that the heated semiconductor substrate has a shape where a central region of the semiconductor substrate separates from the placement surface, or the heated semiconductor substrate has a shape that follows the placement surface.</p> |
申请公布号 |
JP2015154045(A) |
申请公布日期 |
2015.08.24 |
申请号 |
JP20140029581 |
申请日期 |
2014.02.19 |
申请人 |
SUMITOMO ELECTRIC IND LTD |
发明人 |
TANAKA SATOSHI;KUBOTA RYOSUKE;KIMURA ISAMU |
分类号 |
H01L21/02;H01L21/205;H01L21/265;H01L21/683 |
主分类号 |
H01L21/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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