发明名称 OPHTHALMOLOGIC EXAMINATION APPARATUS
摘要 PROBLEM TO BE SOLVED: To objectively measure scattering characteristics of a subject's eye without exerting a harmful influence such as glare on the subject.SOLUTION: An ophthalmologic examination apparatus includes a projection optical system, a first detection part, a second detection part, and a calculation part. The projection optical system projects ring light to the fundus oculi of the subject's eye. The first detection part detects return light of the ring light from the subject's eye. The second detection part detects a central part of the return light. The calculation part calculates a ratio of intensity of at least a part of the ring-shaped part of the return light detected by the first detection part, to intensity of a central part detected by the second detection part.
申请公布号 JP2015150283(A) 申请公布日期 2015.08.24
申请号 JP20140027790 申请日期 2014.02.17
申请人 TOPCON CORP 发明人 OTSUKA HIROYUKI
分类号 A61B3/12;A61B3/14 主分类号 A61B3/12
代理机构 代理人
主权项
地址