| 摘要 |
PROBLEM TO BE SOLVED: To provide an analysis device with which it is possible to obtain a high degree of augmentation in an augmentation degree spectrum, and to detect and analyze a target substance with high sensitivity.SOLUTION: The analysis device comprises: a magnetic field augmentation element 100 including a metal layer 10, a light-transmitting layer 20 on the metal layer, and a plurality of metal particles 30 on the light-transmitting layer; light sources such as linear polarized light polarized in first and second directions, and circular polarized light, etc., with which the magnetic field augmentation element is irradiated; and a detector for detecting the light from the magnetic field augmentation element. The arrangement of the metal particles 30 of the magnetic field augmentation element satisfies the relationship of expression (1). P1<P2≤Q+P1 (1). (P1 and P2 are a pitch; Q represents the pitch of a diffraction lattice that satisfies prescribed relational expression (2), where ω represents the angular frequency of the local existence type Plasmon of the metal particles, &egr;(ω) represents the dielectric constant of metal, &egr; represents the dielectric constant of the periphery of the metal particles, c represents the velocity of light, and &thetas; represents the angle of inclination from the direction of thickness of the metal layer, the angle being an angle at which excitation light is radiated.) The light-transmitting layer satisfies prescribed relational expression (3), where the thickness is represented by G [nm]. |
