| 摘要 |
PROBLEM TO BE SOLVED: To provide an X-ray analysis apparatus capable of measuring a wide variety of samples which are not necessarily flat, known or of a fixed shape.SOLUTION: X-ray analysis of a primary sample such as a flexible sheet 60 uses apparatus having a primary sample holder such as a material feed-through system 20 for moving the flexible sheet through the apparatus. An X-ray analysis head 6 containing an X-ray source and an X-ray detector is mounted on a robot arm 4. The robot arm moves in three dimensions so that the analysis head can be brought into position to measure the flexible sheet as it is being brought through the apparatus by the material feed-through system. |
