发明名称 |
CONTACT RESISTANCE MEASUREMENT SYSTEM |
摘要 |
<p>PROBLEM TO BE SOLVED: To measure the contact resistance of a contact part of a charge/discharge test device simply.SOLUTION: A first voltmeter 41 measures a potential difference in the first and the second areas of a positive electrode dummy tab 10d. A second voltmeter 42 measures a potential difference in the first and the second areas of a negative electrode dummy tab 20d. The first and the second areas of a positive electrode dummy tab 10d are insulated, and the first and the second areas of a negative electrode dummy tab 20d are insulated. The second area of the positive electrode dummy tab 10d and the second area of the negative electrode dummy tab 20d are electrically connected. The first area of the positive electrode dummy tab 10d is contacted by one of a plurality of pawls of a positive electrode contact part 60. The second area of the positive electrode dummy tab 10d is contacted by at least one of the remainder of the plurality of pawls of the positive electrode contact part 60. The first area of the negative electrode dummy tab 20d is contacted by one of a plurality of pawls of a negative electrode contact part 70. The second area of the negative electrode dummy tab 20d is contacted by at least one of the remainder of the plurality of pawls of the negative electrode contact part 70.</p> |
申请公布号 |
JP2015152426(A) |
申请公布日期 |
2015.08.24 |
申请号 |
JP20140026369 |
申请日期 |
2014.02.14 |
申请人 |
FUJITSU TELECOM NETWORKS LTD |
发明人 |
TSUSHIMA HIROKI;HARASAWA KAZUKI |
分类号 |
G01R31/36;G01R27/02;H01M10/44;H02J7/00 |
主分类号 |
G01R31/36 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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