发明名称 SEMICONDUCTOR BONDING METHOD
摘要 <p>PROBLEM TO BE SOLVED: To provide a semiconductor bonding method which prevents the occurrence of voids and non-uniform film thickness of a bonding part, which are caused by a volatile gas or volumetric shrinkage at the time of sintering a metal nano bonding material.SOLUTION: A semiconductor bonding method includes: a first process of coating a first conductive bonding material 1 containing metal nanoparticles, an organic dispersing agent and an organic solvent on a bonding region of a support medium for fixing a semiconductor chip 5 in the size larger than the size of a bonding part of the semiconductor chip 5 and subsequently heating and temporarily hardening the first conductive bonding material 1; a second process of coating a second conductive bonding material 2 containing metal nanoparticles, an organic dispersing agent and an organic solvent on a top face of the first conductive bonding material 1; a third process of die bonding the semiconductor chip 5 in a manner such that a whole area of the bonding part contacts the top face of the first conductive bonding material 1 and at least a part of a circumference of the bonding part contacts the second conductive bonding material 2; and a fourth process of heating the first conductive bonding material 1 and the second conductive bonding material 2 at the same time and hardening the first conductive bonding material 1 and the second conductive bonding material 2.</p>
申请公布号 JP2015153881(A) 申请公布日期 2015.08.24
申请号 JP20140025812 申请日期 2014.02.13
申请人 ISAHAYA ELECTRONICS CORP 发明人 TAKATSUKI AKIRA;KINOSHITA SHINYA
分类号 H01L21/52 主分类号 H01L21/52
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