发明名称 DEFECT IDENTIFICATION METHOD AND DEFECT IDENTIFICATION SYSTEM
摘要 <p>PROBLEM TO BE SOLVED: To provide a defect identification method and a defect identification system, capable of surely identifying a defective part of a coating film with high accuracy even if concentration of a fluorescent agent in coating liquid is reduced, at low cost.SOLUTION: While transporting a web W having a coating film CF containing a fluorescent agent, in a defect identification method for identifying a defective part during coating, the coating film is irradiated with ultraviolet light so as to straddle the web in the width direction, fluorescent light from an irradiation region IR of the ultraviolet light is detected and the detected ultraviolet light is analyzed to identify a defective part of the coating film.</p>
申请公布号 JP2015152412(A) 申请公布日期 2015.08.24
申请号 JP20140026186 申请日期 2014.02.14
申请人 LINTEC CORP 发明人 MORI TSUYOSHI
分类号 G01N21/89;B05D3/00;B05D5/06 主分类号 G01N21/89
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