发明名称 |
AN INSULATION CONDITION ASSESSMENT INSTRUMENT FOR PERFORMING FREQUENCY DOMAIN SPECTROSCOPY EMPLOYING TIME GROWING FREQUENCY EXCITATION AND A METHOD FOR THE SAME |
摘要 |
<p>ABSTRACT AN INSULATION CONDITION ASSESSMENT INSTRUMENT FOR PERFORMING FREQUENCY DOMAIN SPECTROSCOPY EMPLOYING TIME GROWING FREQUENCY EXCITATION AND A METHOD FOR THE SAME An insulation condition assessment instrument (A) comprises of at least two switches 1 and 2 for connecting two terminals (x, y) of a dielectric material sample (7) under test to the common connection points (c) and (d) of said two switches, a host computer (14) connected to a microcontroller (3) which is connected through 8/16/32 bit data bus to FPGA (4). FGPA (4) is connected to high voltage amplifier (6) as well as to ADC (10, 11), which is in turn connected to a programmable voltage sensing unit (9) and a programmable current sensing unit (8), respectively. A time growing frequency excitation voltage waveform is impressed by said high voltage amplifier (6) upon the dielectric sample (7). A process of performing FDS with instrument (A) is also disclosed. Fig. 1</p> |
申请公布号 |
IN865KO2015(A) |
申请公布日期 |
2015.08.21 |
申请号 |
IN2015KO00865 |
申请日期 |
2015.08.07 |
申请人 |
CHAKRAVORTI, SIVAJI;CHATTERJEE, BISWENDU;DEY, DEBANGSHU |
发明人 |
CHAKRAVORTI, SIVAJI;CHATTERJEE, BISWENDU;DEY, DEBANGSHU |
分类号 |
G01N25/00 |
主分类号 |
G01N25/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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