发明名称 DATA QUALITY MEASUREMENT METHOD BASED ON A SCATTER PLOT
摘要 A data quality measurement method based on a scatter plot, the method comprising: defining a data grid (Gxy) and fitting a plurality of trend lines; using a scatter plot to display data and according to actual trends, selecting a trend line and displaying same; generating data quality rules according to the determined trend line type and parameters; selecting appropriate data quality rules and measuring data quality according to a threshold. By means of defining the data grid (Gxy) to store data, using a scatter plot to display data, and generating data quality rules according to the determined trend line type and parameters, and further setting a threshold according to said rules and measuring data quality, applications such as display of data, analysis of abnormal data, and data error correction can be performed for enormous amounts of data. Another embodiment provides a data quality measurement system based on a scatter plot.
申请公布号 KR20150095874(A) 申请公布日期 2015.08.21
申请号 KR20157018964 申请日期 2014.08.18
申请人 SHENZHEN AUDAQUE DATA TECHNOLOGY LTD. 发明人 WANG MINGXING;FAN WENFEI;JIA XIBEI
分类号 G06F11/07;G06F11/00;G06F17/18 主分类号 G06F11/07
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