| 摘要 |
PROBLEM TO BE SOLVED: To provide a charged particle detection device or the like in which calibration is easily automated, and consequently, a complicated operation by an operator is not required or can be reduced.SOLUTION: A charged particle detection device 1 includes: an electron detection part 14; a signal processing part 15; a selection part 25; an accumulation part 30 for accumulating information of muons; and a calculation part 32. The electron detection part detects ionized electrons occurred along tracks of charged particles flying inside a scatterer 12. The signal processing part processes the signals detected by the electron detection part, and obtains information of charged particles. The selection part selects the information of muons from information of the charged particles detected by the signal processing part. The calculation part obtains a coefficient relating to the sensitivity of the information detection of the charged particles based on the information of the accumulated muons. |
