发明名称 |
Determining Soft Error Infliction Probability |
摘要 |
A method, system and product for determining error infliction probability or probability. The method comprises obtaining a representation of a circuit, wherein the circuit comprises nodes, wherein the nodes comprise at least one critical node; obtaining a trace, wherein the trace comprises recorded values of the nodes in a plurality of cycles; determining, by a processor, a Soft Error Infliction Probability (SEIP) of a node, wherein the SEIP is a value representing a probability that a Single Event Upset (SEU) effecting the node in a cycle will inflict a soft error by propagating through the circuit to the at least one critical node, wherein said determining comprises simulating a propagation of the SEU from the cycle to consecutive cycles, wherein said simulating utilizes values from the trace which are associated with the consecutive cycles; and outputting the SEIP of the node. |
申请公布号 |
US2015234967(A1) |
申请公布日期 |
2015.08.20 |
申请号 |
US201514601312 |
申请日期 |
2015.01.21 |
申请人 |
Optima Design Automation Ltd |
发明人 |
Mazzawi Jamil Raja;Mouallem Ayman Kamil |
分类号 |
G06F17/50 |
主分类号 |
G06F17/50 |
代理机构 |
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代理人 |
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主权项 |
1. A computer-implemented method comprising:
obtaining a representation of a circuit, wherein the circuit comprises nodes, wherein the nodes comprise at least one critical node; obtaining a trace, wherein the trace comprises recorded values of the nodes in a plurality of cycles; determining, by a processor, a Soft Error Infliction Probability (SEIP) of a node, wherein the SEIP is a value representing a probability that a Single Event Upset (SEU) effecting the node in a cycle will inflict a soft error by propagating through the circuit to the at least one critical node, wherein said determining comprises simulating a propagation of the SEU from the cycle to consecutive cycles, wherein said simulating utilizes values from the trace which are associated with the consecutive cycles; and is outputting the SEIP of the node. |
地址 |
Nazareth IL |