发明名称 |
N-wavelength interrogation system and method for multiple wavelength interferometers |
摘要 |
In an interrogation system for multiple wavelength interferometers a fringe spectrum that includes non-quadrature-spaced radiation-intensity samples is analyzed to obtain a high resolution relative phase measurement of the optical path-length difference associated with the fringe spectrum. The fringe spectrum can be analyzed to obtain a fringe number and a quadrant as well, which can be combined with the relative phase measurement to obtain a high precision measurement of the absolute optical path-length difference. An environmental condition corresponding to the absolute optical path-length difference can be measured using the measurement of the absolute optical path-length difference. |
申请公布号 |
AU2014209027(A1) |
申请公布日期 |
2015.08.20 |
申请号 |
AU20140209027 |
申请日期 |
2014.01.28 |
申请人 |
WOODS HOLE OCEANOGRAPHIC INSTITUTION |
发明人 |
KAPIT, JASON A.;FARR, NORMAN ERWIN;SCHMITT, RAYMOND W. |
分类号 |
G01B9/02;G01D5/26 |
主分类号 |
G01B9/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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