发明名称 QUALITY CONTROL SYSTEM AND INTERNAL INSPECTION DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To increase a speed at which internal inspection is performed in a surface-mounting line.SOLUTION: Provided is a quality control system having a visual inspection device for inspecting the bonded state of an electrode on a printed circuit board and a component mounted by soldering on the printed circuit board by means of a visible-light image and an internal inspection device for inspecting the bonded state of the electrode on the printed circuit board and the component mounted by soldering on the printed circuit board by means of other than the visible-light image, the quality control system being characterized in that the visual inspection device generates terminal information that is the information relating to the positions of terminals that the electronic component has on the printed circuit board, and the internal inspection device determines, on the basis of the terminal information, an area in which inspection is performed.</p>
申请公布号 JP2015148509(A) 申请公布日期 2015.08.20
申请号 JP20140021367 申请日期 2014.02.06
申请人 OMRON CORP 发明人 MORI HIROYUKI;TANAKA MAYUKO
分类号 G01N21/956;H05K3/34 主分类号 G01N21/956
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