发明名称 SAMPLE CONVEYOR APPARATUS AND SPECIMEN TESTING AUTOMATION SYSTEM
摘要 In a conventional conveyor line, an empty specimen rack conveyor line is provided separately from a specimen rack conveyor line having a specimen mounted thereon. However, crossing of the conveyor lines leads to the decrease in processing speed. Also, when a specimen rack conveyor line and an empty specimen rack conveyor line are configured on two stages, a vertical movement mechanism or the like needs to be added in order to connect the upper-stage conveyor line and the lower-stage conveyor line, and there is a possibility that the system is complicated and the cost thereof is increased. In the present invention, by connecting an empty holder conveyor line and a main conveyor line disposed up and down on two stages via one conveyor line having a horizontal part and an inclined part, crossing of the conveyor lines can be eliminated and an inexpensive structure can be achieved.
申请公布号 US2015233955(A1) 申请公布日期 2015.08.20
申请号 US201314422716 申请日期 2013.08.30
申请人 Hitachi High-Technologies Corporation 发明人 Nemoto Tomoyuki;Fukugaki Tatsuya;Tsujimura Naoto
分类号 G01N35/04;B65G23/04;B65G23/44;B65G21/20;B65G15/22 主分类号 G01N35/04
代理机构 代理人
主权项 1. A sample conveyor apparatus comprising: two or more conveyor paths provided along a conveyor route; a belt used in common by the conveyor paths; and a driving source which drives the belt, thereby conveying at least any of a sample, a sample holder, and a sample rack mounted on the belt, wherein the two or more conveyor paths are disposed so as to form a predetermined angle, and adjusting means which adjusts an angle of the belt is provided at a connecting part of the conveyor paths.
地址 Tokyo JP
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