发明名称 |
SPATIAL MODULATION OF LIGHT TO DETERMINE DIMENSIONAL CHARACTERISTICS OF OBJECTS IN A FLOW PATH |
摘要 |
A device includes a spatial filter arranged in a Cartesian coordinate system having orthogonal x, y, and z axes. The spatial filter has mask features that are more light transmissive and mask features that are less light transmissive. The mask features are arranged along the x-axis in the flow direction of a flow path. A detector is positioned to detect light emanating from at least one object in the flow path, the object having a width along the y-axis, a thickness along the z-axis, and a length along the x-axis. Light emanating from the object is time modulated according to the mask features as the object moves along the flow path. The detector is configured to generate a time-varying electrical signal in response to the detected light that includes information about the width or thickness of the object. |
申请公布号 |
US2015233704(A1) |
申请公布日期 |
2015.08.20 |
申请号 |
US201414181524 |
申请日期 |
2014.02.14 |
申请人 |
Palo Alto Research Center Incorporated |
发明人 |
Martini Joerg;Bern Marshall W.;Johnson Noble M.;Kiesel Peter;Kletter Doron;Cheng Bowen;Recht Michael I. |
分类号 |
G01B11/04;G01B11/06 |
主分类号 |
G01B11/04 |
代理机构 |
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代理人 |
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主权项 |
1. An assembly, comprising:
a spatial filter arranged in a Cartesian coordinate system having orthogonal x, y, and z axes, the spatial filter including mask features that are more light transmissive and mask features that are less light transmissive, the mask features arranged along the and x-axis in a flow direction of a flow path; a detector positioned to detect light emanating from at least one object in the flow path, the object having a width along the y-axis, a thickness along the z-axis, and a length along the x-axis, the light emanating from the object time modulated according to the mask features as the object moves along the flow path, the detector configured to generate a time-varying electrical signal in response to the detected light; and an analyzer configured to determine the width or thickness of the object based on the signal. |
地址 |
Palo Alto CA US |