发明名称 SEMICONDUCTOR DEVICE MANUFACTURING METHOD
摘要 <p>PROBLEM TO BE SOLVED: To provide an art favorable to improve yield and reduce manufacturing cost in a manufacturing method of a semiconductor device with a structure having an inclined surface.SOLUTION: A semiconductor device manufacturing method comprises: a first process of forming on a silicon substrate, a member provided with an opening to make a part of a top face of the silicon substrate be an exposed surface; and a second process of etching the member by supplying a XeF-containing etching gas to the exposed surface and the member in a manner such that a thickness of the member increases with the distance from the exposed surface.</p>
申请公布号 JP2015149366(A) 申请公布日期 2015.08.20
申请号 JP20140020748 申请日期 2014.02.05
申请人 CANON INC 发明人 KURASHIMA TAMAYOSHI;TSUNODA TAKAYUKI
分类号 H01L21/3065;H01L27/14 主分类号 H01L21/3065
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