Cell Internal Defect Diagnosis

摘要

Various aspects of the disclosed technology relate to cell internal defect diagnosis techniques. Defect candidates are first determined based on path-tracing through a circuit design. Then, cell internal defect suspects are determined from the defect candidates based on simulating failing test patterns by using cell internal fault models. The defect candidate determination may be further based on simulating the failing test patterns by using conventional fault models. The cell internal defect suspect determination may be further based on simulating passing test patterns by using the cell internal fault models.

主权项

1. A method, executed by at least one processor of a computer, comprising:
determining defect candidates based on path-tracing through a circuit design, wherein the path-tracing comprises probing from failing observation points into the circuit design; and determining cell internal defect suspects from the defect candidates based on simulating failing test patterns that generate failing values at the failing observation points by using cell internal fault models.