发明名称 OPTICAL INSPECTION APPARATUS AND METHOD OF OPTICAL INSPECTION
摘要 <p>An optical inspection apparatus comprises: a first light source which irradiates a display panel with light having a first wavelength; a second light source which irradiates the display panel with light having a second wavelength; a third light source which irradiates the display panel with light having a third wavelength; a camera which includes a first filter passing the light having the first wavelength reflected from the display panel, a second filter passing the light having the second wavelength reflected from the display panel, a third filter passing the light having the third wavelength reflected from the display panel, a first charge coupling element disposed corresponding to the first filter, a second charge coupling element disposed corresponding to the second filter, and a third charge coupling element disposed corresponding to the third filter; and an image analyzing unit which analyzes a defect of the display panel by combining a first image acquired from the first charge coupling element, a second image acquired from the second charge coupling element, and a third image acquired from the third charge coupling element.</p>
申请公布号 KR20150094948(A) 申请公布日期 2015.08.20
申请号 KR20140015890 申请日期 2014.02.12
申请人 SAMSUNG DISPLAY CO., LTD. 发明人 KIM, JAE CHEON
分类号 G01N21/88;G01B11/00 主分类号 G01N21/88
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