发明名称 |
Method For Manufacturing Semiconductor Device Using Mold Having Resin Dam And Semiconductor Device |
摘要 |
The suppression of resin leakage is combined with the suppression of damage to the functional wiring area of a wiring board in forming an encapsulation resin. A method for manufacturing a semiconductor device includes the step of clamping a wiring board with a first mold and a second mold. The second mold includes: a flat portion contacting a wiring board; a recessed portion forming a cavity to form an encapsulation resin; and a projecting portion formed at a location spaced apart from the recessed portion on the flat portion, the projecting portion projecting on the first mold side, and extending along the first edge of the wiring board. |
申请公布号 |
US2015235937(A1) |
申请公布日期 |
2015.08.20 |
申请号 |
US201514704335 |
申请日期 |
2015.05.05 |
申请人 |
Renesas Electronics Corporation |
发明人 |
Noda Takamitsu |
分类号 |
H01L23/498;H01L23/544;H01L23/29 |
主分类号 |
H01L23/498 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor device comprising:
a wiring board having opposite first and second surfaces, the first surface including a first region and a second region surrounding the first region, the wiring board when seen in a plane view including a first edge; a semiconductor device mounted over the first region; an encapsulation resin formed over the first region and encapsulating the semiconductor device, the encapsulation resin not being formed over the second region; an external terminal formed on the second surface; and a dent formed in the second region at a location spaced apart from the first region, the dent extending along the first edge. |
地址 |
Kawasaki-shi JP |