TESTING TRAY

摘要

A testing tray includes a receiving member and a connector. The receiving includes a tray and a latching member. The tray includes a bottom wall, a peripheral sidewall protruded from the bottom wall, a resisting member and a guide groove. The resisting member includes a resisting portion and two elastic portions coupling the resisting portion with the peripheral sidewall. The tray includes at least one latching portion protruded from the peripheral sidewall. The latching member includes a sliding portion slidably mounted on the bottom wall to cover the guide groove and an elastic member located between the sliding portion and the bottom wall. The connector includes a fixed member detachably mounted on the at least one latching portion and a conducting member detachably mounted on the fixed member. The conducting member is capable of coupling the electronic device with a testing device.

主权项

1. A testing tray for receiving an electronic device, the testing tray comprising:
a receiving member, comprising
a tray comprising a bottom wall and a peripheral sidewall protruded from the bottom wall; the bottom wall and the peripheral sidewall cooperatively defining a receiving space configured to receive the electronic device; the tray further comprising a resisting member located on the peripheral sidewall and a guide groove defined on the peripheral sidewall; the resisting member comprising a resisting portion and two elastic portions coupling the resisting portion with the peripheral sidewall; the tray further comprising at least one latching portion protruding from the peripheral sidewall and located proximate the guide groove; anda latching member comprising a sliding portion and an elastic member, the sliding portion slidably mounted on the bottom wall and covering the guide groove; the elastic member located between the sliding portion and the bottom wall; and a connector comprising a fixed member detachably mounted on the latching portion and a conducting member detachably mounted on the fixed member, the conducting member being configured to couple the electronic device and a testing device.