发明名称 METHOD FOR IDENTIFYING A CRYSTALLOGRAPHIC CANDIDATE PHASE OF A CRYSTAL
摘要 According to the invention a method is provided for identifying a crystallographic candidate phase of a crystal in an EBSD diffraction pattern, which includes the following steps: Sorting and indexing of the bands of the diffraction pattern in order of decreasing intensity. Providing of indices of the diffraction bands of candidate phases, which are to be expected as a result of the EBSD pattern acquisition, in a database, wherein all the indices provided can, in each case, be assigned to a candidate phase. Identification of the expected bands with the bands measured in the diffraction pattern for each candidate phase. Comparison of the intensities of bands of the measured diffraction pattern with intensities which were predicted for the diffraction bands of the candidate phases, which are to be expected as a result of the EBSD pattern acquisition, the indices of said candidate phases being stored in the database. In addition, a corresponding computer program and a computer-readable storage medium are provided, on which a computer program according to the invention is stored.
申请公布号 US2015233843(A1) 申请公布日期 2015.08.20
申请号 US201514621580 申请日期 2015.02.13
申请人 Bruker Nano GmbH 发明人 Schwager Thomas
分类号 G01N23/207;G01N23/203 主分类号 G01N23/207
代理机构 代理人
主权项 1. A method for identifying a crystallographic candidate phase of a crystal in an EBSD diffraction pattern, comprising the steps of: (i) Sorting and indexing of the bands of the diffraction pattern in order (R) of decreasing intensity; (ii) Providing of indices of the diffraction bands of candidate phases, which are to be expected as a result of the EBSD pattern acquisition, in a database, wherein all the indices provided can, in each case, be assigned to a candidate phase; (iii) Identification of the expected bands with the bands measured in the diffraction pattern for each candidate phase; and (iv) Comparison of the intensities of bands of the measured diffraction pattern with intensities which were predicted for the diffraction bands of the candidate phases, which are to be expected as a result of the EBSD pattern acquisition, the indices of said candidate phases being stored in the database.
地址 Berlin DE