发明名称 半導体装置
摘要 <p>A semiconductor device includes: an electron-transit layer made of a semiconductor, the electron-transit layer having a first band gap; an electron-supply layer disposed on the electron-transit layer, the electron-supply layer being made of a semiconductor having a second band gap that is wider than the first band gap; a barrier-forming layer disposed on the electron-supply layer, the barrier-forming layer being made of a semiconductor having a third band gap that is narrower than the second band gap; an upper-channel layer disposed on the barrier-forming layer, the upper-channel layer being made of a semiconductor doped with an impurity; a side-surface of the barrier-forming layer and the upper-channel layer formed by partly removing the barrier-forming layer and the upper-channel layer; an insulating-film disposed on the side-surface; a gate-electrode disposed on the insulating-film; a source-electrode connected to the upper-channel layer; and a drain-electrode connected to the electron-supply layer or the electron-transit layer.</p>
申请公布号 JP5765147(B2) 申请公布日期 2015.08.19
申请号 JP20110190999 申请日期 2011.09.01
申请人 发明人
分类号 H01L21/338;H01L21/336;H01L21/337;H01L29/778;H01L29/78;H01L29/808;H01L29/812 主分类号 H01L21/338
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