发明名称 半導体装置
摘要 <p>The protective circuit is formed using a non-linear element which includes a gate insulating film covering a gate electrode; a first wiring layer and a second wiring layer which are over the gate insulating film and whose end portions overlap with the gate electrode; and an oxide semiconductor layer which is over the gate electrode and in contact with the gate insulating film and the end portions of the first wiring layer and the second wiring layer. The gate electrode of the non-linear element and a scan line or a signal line is included in a wiring, the first or second wiring layer of the non-linear element is directly connected to the wiring so as to apply the potential of the gate electrode.</p>
申请公布号 JP5766246(B2) 申请公布日期 2015.08.19
申请号 JP20130192573 申请日期 2013.09.18
申请人 发明人
分类号 H01L29/786;G02F1/1368;G02F1/167;H01L21/28;H01L21/822;H01L27/04;H01L29/417;H01L51/50 主分类号 H01L29/786
代理机构 代理人
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