发明名称 |
Spin transistor and memory |
摘要 |
A spin transistor according to an embodiment includes: a first magnetic layer formed above a substrate and serving as one of a source and a drain; an insulating film having a lower face facing to an upper face of the first magnetic layer, an upper face opposed to the lower face, and a side face different from the lower and upper faces, the insulating film being formed on the upper face of the first magnetic layer and serving as a channel; a second magnetic layer formed on the upper face of the insulating film and serving as the other one of the source and the drain; a gate electrode formed along the side face of the insulating film; and a gate insulating film located between the gate electrode and the side face of the insulating film. |
申请公布号 |
US9112139(B2) |
申请公布日期 |
2015.08.18 |
申请号 |
US201213526007 |
申请日期 |
2012.06.18 |
申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
Inokuchi Tomoaki;Marukame Takao;Tanamoto Tetsufumi;Sugiyama Hideyuki;Ishikawa Mizue;Saito Yoshiaki |
分类号 |
H01L43/08;H01L29/66 |
主分类号 |
H01L43/08 |
代理机构 |
Oblon, McClelland, Maier & Neustadt, L.L.P. |
代理人 |
Oblon, McClelland, Maier & Neustadt, L.L.P. |
主权项 |
1. A spin transistor comprising:
a first magnetic layer formed above a substrate and serving as one of a source and a drain; a tunnel insulating film having a lower face being in contact with an upper face of the first magnetic layer, an upper face opposed to the lower face, and a side face different from the lower and upper faces, the tunnel insulating film serving as a channel; a second magnetic layer being in contact with the upper face of the tunnel insulating film and serving as the other one of the source and the drain; a gate electrode formed along the side face of the tunnel insulating film; and a gate insulating film located between the gate electrode and the side face of the tunnel insulating film, wherein a first energy difference between a Fermi level of the gate electrode and a conduction band level of the gate insulating film is larger than a second energy difference between a Fermi level of the first magnetic layer and a conduction band level of the tunnel insulating film. |
地址 |
Tokyo JP |