METHOD FOR ETCHING USING METAL LAYER AS ETCHING RESIST
摘要
An etching method using a metal layer as an etching resist comprises: a step of forming a lower metal layer consisting of a conductive material on an upper surface of an insulator layer consisting of an organic insulator or an inorganic insulator, and an upper metal layer on a top thereof; a step of forming a photosensitive material on an upper surface of the upper metal layer, forming an opening pattern to open a specific part of the photosensitive material; a step of forming a circuit pattern by selectively etching the upper metal layer as a first etchant to etch the upper metal layer passing through the photosensitive material having the opening pattern; a step of removing the photosensitive material using chemicals; and a step of forming the circuit pattern by selectively etching a lower metal layer as a second etchant to etch the lower metal layer passing through the upper metal layer having the circuit pattern.
申请公布号
KR20150093328(A)
申请公布日期
2015.08.18
申请号
KR20140013952
申请日期
2014.02.07
申请人
ITM SEMICONDUCTOR CO., LTD.
发明人
PARK, JUN YOUNG;JEONG, JOO HYUN;KIM, KI BO;SONG, YOUNG JIN;HAN, WON HEE;NOH, SOO CHUN;LEE, SUNG LIM;LEE, HA NA