| 摘要 |
<p>An objective of the present invention is to improve efficiency of inspecting and sorting operation of very small electronic chip components using a device for inspecting and sorting electronic chip components requiring inspection and sorting of the electronic chip components at a high speed and suppress degradation of inspection precision. The device for inspecting and sorting electronic chip components comprises: a base unit; an return disk rotatably shaft-supported on the base unit to return electronic chip components; a component supply loading unit to supply and load the electronic chip components in loading holes formed on the return disk along a rotation path of the return disk; an inspection unit to inspect an electric property of the electronic chip components; and a sorting unit to sort the electronic chip components which have undergone the inspection. An electronic chip component removing means is formed between a rear end location of the electronic chip component supply loading unit and a front end location of the inspection unit, and at a location along the rotation path of the return disk to separate an electronic chip component abnormally loaded in a loading hole from the loading hole.</p> |
