Sensitivity enhancement in grating coupled surface plasmon resonance by azimuthal control

摘要

A method and a system for the enhancement of the sensitivity in surface plasmon resonance (SPR) sensors based metallic grating by exploiting the conical configuration is presented. We consider the propagation of surface plasmon polaritons (SPPs) excited by light from the visible to infrared spectrum range, incident on a plasmonic grating at different directions by varying both the zenith and azimuthal angles. For specific azimuthal angles, SPPs propagate in the grating plane perpendicular to the incident light momentum. This is the condition that allows increasing the number of different excited SPPs modes largely. We exploit this effect to increase the sensor sensitivity with the change of refractive index of thin film on the plasmonic grating surface. Polarization effects also contribute to a further modes enhancement and increase the sensitivity. A scheme for a lab-on-chip implementation of a system that allows a parallel detection in microfluidic channels has been shown.

主权项

1. A surface plasmon resonance sensor in grating coupling configuration, comprising:
a plasmonic crystal grating, with a selected one of a sinusoidal profile or digital profile; a system of microfluidic channels made of a transparent material and placed on top of the grating, which element is referred to as an SPPchip, that is configured to allow the flow of an analyte therethrough; a light source that emits a monochromatic light beam that induces surface plasmon polariton excitation, hereafter called a first beam, which impinges on the SPPchip and is thereby reflected, into a second beam, which identifies with the first beam as a scattering plane; a first polarizer, disposed between the light source and the SPPchip, that is configured to rotate so as to control polarization of the first beam; a second polarizer in the path of the second beam; a rotating stage upon which the SPPchip is placed and configured to rotate azimuthally and so as to control angle of rotation of the scattering plane, thereby controlling an azimuthal angle, which is set at a non-null value during analysis; and an optical system for detecting the second beam thereby detecting information about the analyte, the optical system including a CCD system.