发明名称 Non-volatile semiconductor memory device and method for manufacturing the same
摘要 A non-volatile semiconductor memory device includes a cell array layer including a first wire, one or more memory cells stacked on the first wire, and a second wire formed on the memory cell so as to cross the first wire, wherein the memory cell includes a current rectifying element and a variable resistance element, and an atomic composition ratio of nitrogen is higher than that of oxygen in a part of a sidewall of the current rectifying element.
申请公布号 US9111858(B2) 申请公布日期 2015.08.18
申请号 US201313838722 申请日期 2013.03.15
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 Nishimura Jun;Yasutake Nobuaki;Sakamoto Kei;Okamura Takayuki
分类号 H01L21/336;H01L27/24;H01L45/00 主分类号 H01L21/336
代理机构 Oblon, McClelland, Maier & Neustadt, L.L.P. 代理人 Oblon, McClelland, Maier & Neustadt, L.L.P.
主权项 1. A non-volatile semiconductor memory device comprising a cell array layer including a first wire, one or more memory cells stacked on the first wire, and a second wire formed on the memory cell so as to cross the first wire, wherein the memory cell includes a current rectifying element and a variable resistance element, the current rectifying element is connected to the first wire via a first electrode, the variable resistance element is connected to the current rectifying element via a second electrode and is connected to the second wire via a third electrode, the current rectifying element, the variable resistance element, and the first to third electrodes are each provided with a sidewall nitrided layer on a side surface thereof, each sidewall nitrided layer provided on the side surface of the respective current rectifying element, the variable resistance element, and the first to third electrodes includes nitrogen and an atom included by the respective current rectifying element, the variable resistance element, and the first to third electrodes, and an atomic composition ratio of nitrogen is higher than that of oxygen in a part of a sidewall of the current rectifying element.
地址 Tokyo JP