发明名称 Calibrating temperature coefficients for integrated circuits
摘要 A calibration system and method are disclosed that include a first bias current generator configured for generating a first bias current that is proportional to absolute temperature (PTAT) and a second bias current generator configured for generating a second bias current that is complementary to absolute temperature (CTAT). The first and second bias currents are copied, multiplied and then summed into a total output bias current, which can be used to bias an electronic circuit. A temperature coefficient is calibrated by changing a ratio of the first and second bias current contributions to the total output bias current, while maintaining the same total output bias current level for a given temperature.
申请公布号 US9112513(B2) 申请公布日期 2015.08.18
申请号 US201314085681 申请日期 2013.11.20
申请人 Atmel Corporation 发明人 Gajda Bartosz
分类号 H03L1/02;H03K3/03 主分类号 H03L1/02
代理机构 Fish & Richardson P.C. 代理人 Fish & Richardson P.C.
主权项 1. A method of calibrating a temperature coefficient of a circuit comprising: generating a first bias current that is proportional to absolute temperature; generating a second bias current that is complementary to absolute temperature; summing multiplied copies of the first and second bias currents to provide a total output bias current; changing a ratio between the first and second bias current contributions to the total output bias current by including or excluding the current contributions of one or more of the multiplied copies of the first and second bias currents to the total output bias current while maintaining the total output bias current for a given temperature; adjusting a frequency level of the circuit by simultaneously increasing or decreasing the first and second bias current contributions according to programmable bits; and biasing the circuit with the total output bias current.
地址 San Jose CA US
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