发明名称 |
System and method for mapping anatomical structures and marking them on a substrate |
摘要 |
The present disclosure provides a method and system for mapping anatomical structures and marking them on an image to be printed on a substrate including the steps of inserting an imaging device into a surgical site, obtaining an image of a defect located in the surgical site from the imaging device, adjusting the image, transmitting the image to a printer, and printing the image on a substrate. The printed image may be a size directly proportional to the defect. The adjusting step may further include the steps of setting a minimum margin to be maintained between the perimeter of the defect and the perimeter of the substrate, selecting a shape and size of the substrate, and identifying at least one anatomical feature of the surgical site. |
申请公布号 |
US9107570(B2) |
申请公布日期 |
2015.08.18 |
申请号 |
US201313898887 |
申请日期 |
2013.05.21 |
申请人 |
Covidien LP |
发明人 |
Abuzaina Ferass |
分类号 |
A61B1/04;A61B1/313;A61F2/00;A61B1/00 |
主分类号 |
A61B1/04 |
代理机构 |
|
代理人 |
|
主权项 |
1. A method for mapping anatomical structures and marking them on a substrate for a surgical procedure, comprising:
inserting an imaging device into a surgical site; obtaining an image of a defect located in the surgical site from the imaging device; identifying at least one anatomical feature of the surgical site and marking the at least one anatomical feature on the image; setting a minimum margin to be maintained between an edge of the defect and an edge of the substrate; measuring the defect; transmitting the image to a printer; printing the image on the substrate; inserting the substrate into the surgical site, wherein the substrate includes the image and the at least one anatomical feature is printed on the substrate as a corresponding landmark; and positioning the substrate over the defect such that the corresponding landmark aligns with the at least one anatomical feature. |
地址 |
Mansfield MA US |