Test system

摘要

A test system having a manipulation device and a test unit. The manipulation device has a receiving unit with a socket that accommodates a packaged integrated circuit, which has a top side and a bottom side. A plurality of electrical terminal contacts are formed on the bottom side. In a first state, the manipulation device provides the integrated circuit to the test unit, and during the first state the test unit is disposed above the top side of the integrated circuit and forms a connection with the manipulation device, and the test unit carries out a function test on the integrated circuit. A sensor device is formed on the top side, and the top side of the integrated circuit is oriented in a direction of the test unit and the electrical terminal contacts are electrically connected to the receiving unit of the manipulation device.

主权项

1. A test system comprising:
a test unit; a manipulation device having a receiving unit with a socket fixedly disposed on the receiving unit; and a packaged integrated circuit having a top side and bottom side with at least two electrical terminal contacts being formed on the bottom side, the integrated circuit including a sensor device arranged on the top side of the integrated circuit, the top side of the integrated circuit being oriented in a direction of the test unit and the electrical terminal contacts being electrically connected to the socket on the receiving unit of the manipulation device, wherein, in a first state, via the receiving unit, the manipulation device provides the integrated circuit to the test unit, and wherein, in the first state, the test unit is arranged above the top side of the integrated circuit and forms a connection with the manipulation device via the receiving unit, and the test unit carries out a function test on the integrated circuit.