发明名称 Selective formation of metallic films on metallic surfaces
摘要 Metallic layers can be selectively deposited on one surface of a substrate relative to a second surface of the substrate. In some embodiments, the metallic layers are selectively deposited on copper instead of insulating or dielectric materials. In some embodiments, a first precursor forms a layer on the first surface and is subsequently reacted or converted to form a metallic layer. The deposition temperature may be selected such that a selectivity of above about 50% or even about 90% is achieved.
申请公布号 US9112003(B2) 申请公布日期 2015.08.18
申请号 US201213708863 申请日期 2012.12.07
申请人 ASM International N.V. 发明人 Haukka Suvi P.;Niskanen Antti;Tuominen Marko
分类号 H01L21/768;H01L21/31;H01L21/314;H01L21/02;H01L21/3105;H01L21/285;C23C16/04;C23C16/14 主分类号 H01L21/768
代理机构 Knobbe, Martens, Olson & Bear, LLP 代理人 Knobbe, Martens, Olson & Bear, LLP
主权项 1. A method for selectively depositing a film on a substrate comprising a first metal surface and a second dielectric surface, the method comprising: cleaning the substrate; after cleaning carrying out one or more deposition cycles, each cycle comprising: contacting the substrate with a first precursor comprising silicon or boron to selectively form a layer of first material comprising Si or B on the first metal surface relative to the second dielectric surface; andconverting the first material on the first metal surface to a second metallic material by exposing the first material to a second precursor comprising metal,wherein the selectivity for deposition on the first metal surface relative to the second dielectric surface is greater than about 50%.
地址 NL