发明名称 |
Selective formation of metallic films on metallic surfaces |
摘要 |
Metallic layers can be selectively deposited on one surface of a substrate relative to a second surface of the substrate. In some embodiments, the metallic layers are selectively deposited on copper instead of insulating or dielectric materials. In some embodiments, a first precursor forms a layer on the first surface and is subsequently reacted or converted to form a metallic layer. The deposition temperature may be selected such that a selectivity of above about 50% or even about 90% is achieved. |
申请公布号 |
US9112003(B2) |
申请公布日期 |
2015.08.18 |
申请号 |
US201213708863 |
申请日期 |
2012.12.07 |
申请人 |
ASM International N.V. |
发明人 |
Haukka Suvi P.;Niskanen Antti;Tuominen Marko |
分类号 |
H01L21/768;H01L21/31;H01L21/314;H01L21/02;H01L21/3105;H01L21/285;C23C16/04;C23C16/14 |
主分类号 |
H01L21/768 |
代理机构 |
Knobbe, Martens, Olson & Bear, LLP |
代理人 |
Knobbe, Martens, Olson & Bear, LLP |
主权项 |
1. A method for selectively depositing a film on a substrate comprising a first metal surface and a second dielectric surface, the method comprising:
cleaning the substrate; after cleaning carrying out one or more deposition cycles, each cycle comprising:
contacting the substrate with a first precursor comprising silicon or boron to selectively form a layer of first material comprising Si or B on the first metal surface relative to the second dielectric surface; andconverting the first material on the first metal surface to a second metallic material by exposing the first material to a second precursor comprising metal,wherein the selectivity for deposition on the first metal surface relative to the second dielectric surface is greater than about 50%. |
地址 |
NL |