发明名称 集合基板、发光装置及发光元件之检测方法;AGGREGATE BOARD, LIGHT EMITTING DEVICE, AND METHOD OF TESTING LIGHT EMITTING ELEMENT
摘要 本发明之目的在于提供一种于装载有复数个发光元件之状态下,切断成各个发光装置之前,可实现使发光元件个别地点亮,从而个别地测定发光元件之色调之集合基板。;集合基板具有:绝缘体9,其具有表面及背面;一对第1及第2表面配线11、12,其等系于绝缘体9之表面排列有复数个;一对第1及第2背面配线,其等于绝缘体9之背面排列有复数个;第1内层配线,其系与第2表面配线12及第2背面配线分离,且与第1表面配线11及第1背面配线连接,于绝缘体9之内部沿第1方向延伸;第2内层配线,其系与第1表面配线11及第1背面配线分离,且与第2表面配线12及第2背面配线连接,于绝缘体9之内部具有沿第2方向延伸之部位。; a pair of a first front face wiring pattern and a second front face wiring pattern, a plurality of which are arranged on the front face of the insulator; a pair of a first rear face wiring pattern and a second rear face wiring pattern, a plurality of which are arranged on the rear face of the insulator; at least one first inner layer wiring pattern that is separated from the second front face wiring pattern and the second rear face wiring pattern, that is connected to the first front face wiring pattern and the first rear face wiring pattern, and that extends in a first direction in an interior of the insulator; at least one second inner layer wiring pattern that is separated from the first front face wiring pattern and the first rear face wiring pattern, that is connected to the second front face wiring pattern and the second rear face wiring pattern, and that has a part that extends in a second direction which is different from the first direction, in the interior of the insulator; and the first inner layer wiring pattern and the second inner layer wiring pattern being positioned in the same layer.
申请公布号 TW201532304 申请公布日期 2015.08.16
申请号 TW103145888 申请日期 2014.12.26
申请人 日亚化学工业股份有限公司 NICHIA CORPORATION 发明人 甘利紘一 AMARI, KOICHI
分类号 H01L33/00(2010.01);G01R31/00(2006.01);G01R31/26(2014.01);H01L21/66(2006.01) 主分类号 H01L33/00(2010.01)
代理机构 代理人 陈长文
主权项
地址 日本 JP