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发明名称
半导体元件结构及其形成方法;SEMICONDUCTOR DEVICE STRUCTURE AND METHOD OF MANUFACTURING THE SAME
摘要
提供了形成半导体元件结构之方法的实施例。方法包括于半导体基底上形成闸极堆叠,并于闸极堆叠之侧壁上形成密封结构。方法还包括于半导体基底、密封结构、及闸极堆叠上形成虚置遮蔽层。方法更包括于虚置遮蔽层上进行离子布植制程以于半导体基底中形成源极及汲极区。此外,方法包括在形成源极及汲极区之后,移除虚置遮蔽层。
申请公布号
TW201532276
申请公布日期
2015.08.16
申请号
TW103144712
申请日期
2014.12.22
申请人
台湾积体电路制造股份有限公司 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
发明人
张哲诚 CHANG, CHE CHENG;陈臆仁 CHEN, YI JEN;张永融 CHANG, YUNG JUNG
分类号
H01L29/66(2006.01);H01L29/78(2006.01)
主分类号
H01L29/66(2006.01)
代理机构
代理人
洪澄文颜锦顺
主权项
地址
新竹市新竹科学工业园区力行六路8号 TW
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