| 摘要 |
<p>The present invention relates to an apparatus for testing a light emitting device, which includes: a base layer equipped with a plurality of light emitting devices; an optical measuring instrument provided to at least one position from above and below the base layer as being placed apart from the base layer, and receiving light from the light emitting device which is a target to be measured; and a light path changing member comprises an uneven part which changes a propagation path of the light from the light emitting devices, as a light path changing member provided adjacent to the baser layer under the base layer.</p> |
