发明名称 Semiconductor Device With Shallow Trench Isolation
摘要 A semiconductor device is provided. The semiconductor device includes a semiconductor substrate and a trench isolation. The trench isolation is formed in the semiconductor substrate, and includes an isolation oxide and a spin coating material. The isolation oxide is peripherally enclosed by the semiconductor substrate. The spin coating material is peripherally enclosed by the isolation oxide.
申请公布号 US2015228534(A1) 申请公布日期 2015.08.13
申请号 US201414179659 申请日期 2014.02.13
申请人 Taiwan Semiconductor Manufacturing CO., LTD. 发明人 Wu Shang-Yen;Chuang Chiang-Ming;Hsieh Ping-Pang
分类号 H01L21/762;H01L21/3105;H01L21/02;H01L29/06 主分类号 H01L21/762
代理机构 代理人
主权项
地址 Hsinchu TW