发明名称 METROLOGY TARGETS WITH FILLING ELEMENTS THAT REDUCE INACCURACIES AND MAINTAIN CONTRAST
摘要 The subject application relates to metrology targets with filling elements that reduce inaccuracies and maintain contrast. The present invention provides a metrology target and a method to design the metrology target. The metrology target comprises specified filling elements introduced into identified continuous regions in a given target design, wherein parameters of the introduced filling elements are determined by a trade-off between a contrast requirement and an inaccuracy requirement which is associated via production with the identified continuous regions. The method includes the steps of identifying continuous regions in a target design, and, introducing specified filling elements into the identified continuous regions, wherein parameters of the introduced filling elements are determined by a trade-off between a contrast requirement and an inaccuracy requirement which is associated via production with the identifying continuous regions. At least one of the identifying and the introducing can be carried out by at least one computer processor.
申请公布号 US2015227675(A1) 申请公布日期 2015.08.13
申请号 US201514605425 申请日期 2015.01.26
申请人 KLA-Tencor Corporation 发明人 Amir Nuriel;Yohanan Raviv
分类号 G06F17/50 主分类号 G06F17/50
代理机构 代理人
主权项 1. A method of designing metrology targets, comprising the steps of: identifying continuous regions in a target design; and, introducing specified filling elements into the identified continuous regions, wherein parameters of the introduced filling elements are determined by a trade-off between a contrast requirement and an inaccuracy requirement which is associated via production with the identifying continuous regions, and wherein at least one of the identifying and the introducing is carried out by at least one computer processor.
地址 Milpitas CA US