SYSTEMS AND METHODS FOR QUANTIFYING MULTIPLE REFRACTIONS WITH DIFFRACTION ENHANCED IMAGING

摘要

Systems and methods for detecting small angular changes in an X-ray beam caused by multiple refractions within an object. According to an aspect, a method for detecting an image of an object includes providing a single X-ray source. The method also includes generating a first X-ray beam. Further, the method includes positioning monochromator crystals to intercept the first X-ray beam such that second X-ray beams are produced. The method also includes positioning an object in paths of the second X-ray beams for transmission of the second X-ray beams through the object and emitting from the object transmitted X-ray beams. The method also includes directing the transmitted X-ray beams at angles of incidence on analyzer crystals, wherein the angles of incidence of the analyzer crystals are independently adjustable. Further the method includes detecting an image of the object from each of the X-ray beams diffracted from the analyzer crystals.

主权项

1. A method for detecting an image of an object, the method comprising:
providing a single X-ray source; generating a first X-ray beam using the single X-ray source; positioning a plurality of monochromator crystals to intercept the first X-ray beam such that a plurality of second X-ray beams each having predetermined energy level, is produced; positioning an object in paths of the plurality of second X-ray beams for transmission of the plurality of second X-ray beams through the object and emitting from the object a plurality of transmitted X-ray beams; directing the plurality of transmitted X-ray beams at angles of incidence upon a plurality of analyzer crystals, wherein the angles of incidence of the analyzer crystals are independently adjustable; and detecting an image of the object from each of the X-ray beams diffracted from each analyzer crystal using a plurality of detectors.