THICKNESS ESTIMATION FOR MICROSCOPY

摘要

A method, of detemining at least one thickness parameter of a specimen from a stack of images of the specimen obtained from a microscope at a series of depths is disclosed. The method selects (340), within a region of interest, sets (850) of patches at a plurality of corresponding transverse locations in each image within the stack of images. A depth value is determined (350) at each transverse location from a set of contrast metrics computed for the set of patches at the transverse location, and the method determines (380) at least one thickness parameter for the specimen at the region of interest from at least a distribution (700) of the determined depth values.