发明名称 プラズマエッチング装置およびプラズマエッチング方法
摘要 <p>An upper electrode (34) and a lower electrode (16) are disposed opposite to each other in a process container (10) configured to be vacuum-exhausted. The upper electrode (34) is connected to a first RF power supply (48) configured to apply a first RF power for plasma generation. The lower electrode (16) is connected to a second RF power supply (90) configured to apply a second RF power for ion attraction. The second RF power supply (90) is provided with a controller (95) preset to control the second RF power supply (90) to operate in a power modulation mode that executes power modulation in predetermined cycles between a first power set to deposit polymers on a predetermined film on a wafer (W) and a second power set to promote etching of the predetermined film on the wafer (W).</p>
申请公布号 JP5764186(B2) 申请公布日期 2015.08.12
申请号 JP20130251864 申请日期 2013.12.05
申请人 東京エレクトロン株式会社 发明人 輿石 公;小林 典之;米田 滋;花輪 健一;田原 慈;杉本 勝
分类号 H01L21/3065;H05H1/46 主分类号 H01L21/3065
代理机构 代理人
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