发明名称 VIA STRUCTURES AND SEMICONDUCTOR DEVICES HAVING A VIA PLUG
摘要 Described is a semiconductor device which includes a bottom device and a top device which is arranged on the bottom device. The bottom device includes a bottom substrate, a bottom plug pad which is formed on the bottom substrate, and a bottom interlayer dielectric layer which covers the bottom plug pad. The top device includes a top substrate, a first etch delay structure which is formed on the bottom side of the top substrate, a top plug pad which is formed under the bottom side of the top substrate, a top interlayer dielectric layer which covers the top plug pad, and a via plug which is in contact with the top plug pad and the bottom plug pad by passing through the top substrate. The via plug includes a first part which is in contact with the first etch delay structure and the top plug pad and a second part which is in contact with the bottom plug pad.
申请公布号 KR20150091714(A) 申请公布日期 2015.08.12
申请号 KR20140012275 申请日期 2014.02.03
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK, BYUNG JUN;MOON, CHANG ROK;SHIN, SEUNG HUN;OH, SEUNG HO;OH, TAE SEOK;LEE, JUNE TAEG
分类号 H01L27/146;H01L21/28 主分类号 H01L27/146
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