发明名称 |
VIA STRUCTURES AND SEMICONDUCTOR DEVICES HAVING A VIA PLUG |
摘要 |
Described is a semiconductor device which includes a bottom device and a top device which is arranged on the bottom device. The bottom device includes a bottom substrate, a bottom plug pad which is formed on the bottom substrate, and a bottom interlayer dielectric layer which covers the bottom plug pad. The top device includes a top substrate, a first etch delay structure which is formed on the bottom side of the top substrate, a top plug pad which is formed under the bottom side of the top substrate, a top interlayer dielectric layer which covers the top plug pad, and a via plug which is in contact with the top plug pad and the bottom plug pad by passing through the top substrate. The via plug includes a first part which is in contact with the first etch delay structure and the top plug pad and a second part which is in contact with the bottom plug pad. |
申请公布号 |
KR20150091714(A) |
申请公布日期 |
2015.08.12 |
申请号 |
KR20140012275 |
申请日期 |
2014.02.03 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
PARK, BYUNG JUN;MOON, CHANG ROK;SHIN, SEUNG HUN;OH, SEUNG HO;OH, TAE SEOK;LEE, JUNE TAEG |
分类号 |
H01L27/146;H01L21/28 |
主分类号 |
H01L27/146 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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