发明名称 薄膜トランジスタ及び薄膜トランジスタの製造方法
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a thin-film transistor by which no trouble caused by migration is generated, and which has a sufficiently-small wiring resistance and excellent transistor characteristics, even in the case that an electrode is formed by a wet process. <P>SOLUTION: A thin-film transistor has a gate electrode, a gate insulating film, a source electrode and a drain electrode, and an organic semiconductor layer on a substrate 10. In the thin-film transistor, the source electrode and the drain electrode consist of a three-layer lamination body. In the three-layer lamination body, the film thickness of each layer decreases in the order of a first layer, a second layer, and a third layer. <P>COPYRIGHT: (C)2012,JPO&INPIT</p>
申请公布号 JP5760360(B2) 申请公布日期 2015.08.12
申请号 JP20100217626 申请日期 2010.09.28
申请人 发明人
分类号 H01L29/786;H01L21/28;H01L21/288;H01L21/336;H01L29/417;H01L51/05 主分类号 H01L29/786
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