| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a method of inspecting an electrophotographic photoreceptor, efficiently inspecting a local structure existing on the photoreceptor with high accuracy. <P>SOLUTION: The method includes: a charging step of applying an electric charge to a photoreceptor; a developing step for the photoreceptor passed through the charging step; a primary transfer step of transferring a primary visible image formed on the surface of the photoreceptor through the developing step to an intermediate transfer member; a secondary visible image forming step of forming a secondary visible image obtained by superposing a plurality of the primary visible images on the intermediate transfer member by performing the primary transfer step two or more times on the photoreceptor; a secondary transfer step of transferring the secondary visible image to paper; a fixing step of fixing the tertiary visible image transferred to the paper on the paper; an image taking step of taking image data from the image fixed on the paper through the fixing step; and an analysis step of analyzing the presence of a specific pattern from the image data to examine the presence of an image defect caused by the local structure on the surface of the photoreceptor, wherein the specific pattern is a pattern generated by providing a difference between an integer multiple of one rotation period of the photoreceptor and one rotation period of the intermediate transfer body. <P>COPYRIGHT: (C)2011,JPO&INPIT</p> |
